PP-1000 analyzes the structure of polymers and film in-situ (on site) and in real time by using the small angle light scattering method. This analyzer is able to analyze larger structures (μm order) compared to analyzers that use x-rays and neutron beams because it uses visible light. Evaluation of optical anisotropy and analysis of spherulite diameter of crystalline film can be carried out from Hv scattering which uses polarizers. Analysis of polymer blend correlation length can be carried out from Vv scattering.
Measures scattering angle of 0.33 to 45 degrees in 10 msec at the fastest ※
Evaluates structures of submicron to several hundred micron size
Measures solution samples with specialized cells
Allows user to easily switch between Hv and Vv scattering with software
Can be set up in labs because it is a table-top type
※When not using HDR function
Phase separation process of polymer blends
Crystallization process of polymers
Calculation of crystal size, crystallization growth rate
Orientation state
Aggregation process
Thermoset process
Structure change when temperature change occurs
Structure change caused by stretching※
Curing process caused by ultraviolet light※
※These items require separate consultation. Please feel free to contact us about details for these items.
Spherulite diameter 1.3～270μm
Correlation length 0.1～100μm
Measures scattering angle of 0.33 to 45 degrees in 10 msec at the fastest ※
Evaluates structures of submicron to several hundred micron size
Measures solution samples with specialized cells
Allows user to easily switch between Hv and Vv scattering with software
Can be set up in labs because it is a table-top type
※When not using HDR function
Phase separation process of polymer blends
Crystallization process of polymers
Calculation of crystal size, crystallization growth rate
Orientation state
Aggregation process
Thermoset process
Structure change when temperature change occurs
Structure change caused by stretching※
Curing process caused by ultraviolet light※
※These items require separate consultation. Please feel free to contact us about details for these items.
Spherulite diameter 1.3～270μm
Correlation length 0.1～100μm
| Measurement principle | Small angle light scattering method | ||
| Light source | Semiconductor laser （wavelength 785nm） | ||
| Detector | CMOS Camera | ||
| Measurement range (Theoretical value) | Spherulite diameter 1.3～270μm Correlation length 0.1～100μm | ||
| Dynamic range | From 120db +（when using HDR function） | ||
| Measurement angle | 0.33°～45°（dependent on camera length） | ||
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| Obtained pattern | Hv scattering pattern,Vv scattering pattern | ||
| Measurement spot | Approx. 1mm | ||
| Beam stopper | φ3mm | ||
| Measurement time | 10msec～ ※ | ||
| Power requirements | AC100-240V 75VA | ||
| Size | W350×D500×H760（mm） | ||
| Data processing unit | Laptop PC（Windows10） |
